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Cases
a3922klptr-t SAT test report
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TPS62160DSGR test report
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AD7276AUJZ-REEL7 test report
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XC7Z020-2CLG484I test report
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ADXL357BEZ-RL7 test report
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DRV8850RGYR test report
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Standards
Failure Analysis GJB548B-2005 Microelectronic device test methods and procedure methods 5003
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X-Ray detection X-Ray: GJB 360B-2009 Method 209
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Soderability Test MIL-STD-883K-2017 2003.13
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Hi-temp and Low-temp Test Integrated circuit: GJB548B-2005-method 1010>
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Decapsulation Standards: MIL-STD-883K-2017 2010.14
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External Visual Inspection Standards: MIL-STD-883K-2017 2009.13
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